Scanning Electron Microscopy (SEM)

Thursday, March 12, 2015

SEM or Scanning Electron Microscopy is used in the mirco analysis and failure analysis of solid materials. Using electronic signals, the SEM produces images of a sample revealing information about the texture, composition and orientation of the material in question. In most applications, data is collected over a targeted area, rendering a two-dimensional image that displays detailed variations of the material’s structure. This detailed imagery helps our Material Scientist to determine the basis of any material defects and/or the root cause of failure.

Here at MVMTC we perform SEM analysis using an AMRAY 1830 SEM. Our state-of-the-art technology enables us to perform microscopy at high magnifications as well as generate high-resolution imagery.  As an accredited testing facility, we also offer a metallography lab, cyclic corrosion testing and our very own machine shop. We are here to act as your manufacturing partner, offering you a one-stop-shop for materials testing and analysis.

For more information please visit our website or contact us today!

No comments:

Post a Comment

There was an error in this gadget